Ludwig Reimer
Springer Berlin Heidelberg
2e druk, 2010
9783642083723
Scanning Electron Microscopy
Physics of Image Formation and Microanalysis
Specificaties
Paperback, 529 blz.
|
Engels
Springer Berlin Heidelberg |
2e druk, 2010
ISBN13: 9783642083723
Rubricering
Onderdeel van serie
Springer Series in Optical Sciences
Verwachte levertijd ongeveer 9 werkdagen
Samenvatting
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Specificaties
ISBN13:9783642083723
Taal:Engels
Bindwijze:paperback
Aantal pagina's:529
Uitgever:Springer Berlin Heidelberg
Druk:2
Inhoudsopgave
Electron Optics of a Scanning Electron Microscope.- Electron Scattering and Diffusion.- Emission of Backscattered and Secondary Electrons.- Electron Detectors and Spectrometers.- Image Contrast and Signal Processing.- Electron-Beam-Induced Current and Cathodoluminescence.- Special Techniques in SEM.- Crystal Structure Analysis by Diffraction.- Elemental Analysis and Imaging with X-Rays.