Bharat Bhushan,
Satoshi Kawata
Springer Berlin Heidelberg
0e druk, 2010
9783642072123
Applied Scanning Probe Methods VI
Characterization
Specificaties
Paperback, 338 blz.
|
Engels
Springer Berlin Heidelberg |
0e druk, 2010
ISBN13: 9783642072123
Rubricering
Onderdeel van serie
NanoScience and Technology
Verwachte levertijd ongeveer 8 werkdagen
Samenvatting
The first volume in the series was released in January 2004 and the second to fourth volumes in early 2006. The field is now progressing so fast that there is a need for one volume every 12 to 18 months to capture latest developments.
Volume VI presents 10 chapters on a variety of new and emerging techniques and refinements of SPM applications.
Specificaties
ISBN13:9783642072123
Taal:Engels
Bindwijze:paperback
Aantal pagina's:338
Uitgever:Springer Berlin Heidelberg
Druk:0
Inhoudsopgave
Scanning Tunneling Microscopy of Physisorbed Monolayers: From Self-Assembly to Molecular Devices.- Tunneling Electron Spectroscopy Towards Chemical Analysis of Single Molecules.- STM Studies on Molecular Assembly at Solid/Liquid Interfaces.- Single-Molecule Studies on Cells and Membranes Using the Atomic Force Microscope.- Atomic Force Microscopy of DNA Structure and Interactions.- Direct Detection of Ligand-Protein Interaction Using AFM.- Dynamic Force Microscopy for Molecular-Scale Investigations of Organic Materials in Various Environments.- Noncontact Atomic Force Microscopy.- Tip-Enhanced Spectroscopy for Nano Investigation of Molecular Vibrations.- Investigating Individual Carbon Nanotube/Polymer Interfaces with Scanning Probe Microscopy.