C. Claeys,
E. Simoen
Springer Berlin Heidelberg
2002e druk, 2002
9783540433934
Radiation Effects in Advanced Semiconductor Materials and Devices
Specificaties
Gebonden, 404 blz.
|
Engels
Springer Berlin Heidelberg |
2002e druk, 2002
ISBN13: 9783540433934
Rubricering
Onderdeel van serie
Springer Series in Materials Science
Verwachte levertijd ongeveer 9 werkdagen
Samenvatting
This wide-ranging book summarizes the current knowledge of radiation defects in semiconductors, outlining the shortcomings of present experimental and modelling techniques and giving an outlook on future developments. It also provides information on the application of sensors in nuclear power plants.
Specificaties
ISBN13:9783540433934
Taal:Engels
Bindwijze:gebonden
Aantal pagina's:404
Uitgever:Springer Berlin Heidelberg
Druk:2002
Inhoudsopgave
Radiation Environments and Component Selection Strategy.- Basic Radiation Damage Mechanisms in Semiconductor Materials and Devices.- Displacement Damage in Group IV Semiconductor Materials.- Radiation Damage in GaAs.- Space Radiation Aspects of Silicon Bipolar Technologies.- Radiation Damage in Silicon MOS Devices.- GaAs Based Field Effect Transistors for Radiation-Hard Applications.- Opto-Electronic Components for Space.- Advanced Semiconductor Materials and Devices - Outlook.