Atomic and Nuclear Analytical Methods

XRF, Mössbauer, XPS, NAA and Ion-Beam Spectroscopic Techniques

Specificaties
Gebonden, 376 blz. | Engels
Springer Berlin Heidelberg | 2007e druk, 2007
ISBN13: 9783540302773
Rubricering
Springer Berlin Heidelberg 2007e druk, 2007 9783540302773
€ 300,99
Levertijd ongeveer 8 werkdagen

Samenvatting

This book compares and offers a comprehensive overview of nine analytical techniques important in material science and many other branches of science. All these methods are already well adapted to applications in diverse fields such as medical, environmental studies, archaeology, and materials science. This clearly presented reference describes and compares the principles of the methods and the various source and detector types.

Specificaties

ISBN13:9783540302773
Taal:Engels
Bindwijze:gebonden
Aantal pagina's:376
Uitgever:Springer Berlin Heidelberg
Druk:2007

Inhoudsopgave

X-ray Fluorescence (XRF) and Particle-Induced X-ray Emission (PIXE).- Rutherford Backscattering Spectroscopy.- Elastic Recoil Detection.- Mössbauer Spectroscopy (MS).- X-Ray Photoelectron Spectroscopy.- Neutron Activation Analysis.- Nuclear Reaction Analysis and Particle-Induced Gamma-Ray Emission.- Accelerator Mass Spectrometry (AMS).
€ 300,99
Levertijd ongeveer 8 werkdagen

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        Atomic and Nuclear Analytical Methods