Assim Boukhayma
Springer International Publishing
e druk, 2018
9783319886572
Ultra Low Noise CMOS Image Sensors
Specificaties
Paperback, blz.
|
Engels
Springer International Publishing |
e druk, 2018
ISBN13: 9783319886572
Rubricering
Onderdeel van serie
Springer Theses
Verwachte levertijd ongeveer 9 werkdagen
Samenvatting
This thesis provides a thorough noise analysis for conventional CIS readout chains, while also presenting and discussing a variety of noise reduction techniques that allow the read noise in standard processes to be optimized. Two physical implementations featuring sub-0.5-electron RMS are subsequently presented to verify the proposed noise reduction techniques and provide a full characterization of a VGA imager. Based on the verified noise calculation, the impact of the technology downscaling on the input-referred noise is also studied.
Further, the thesis covers THz CMOS image sensors and presents an original design that achieves ultra-low-noise performance. Last but not least, it provides a comprehensive review of CMOS image sensors.
Specificaties
ISBN13:9783319886572
Taal:Engels
Bindwijze:paperback
Uitgever:Springer International Publishing
Serie:Springer Theses
Inhoudsopgave
<p>Introduction.- Low-Noise CMOS Image Sensors.- Noise Sources and Mechanisms in CIS.- Detailed Noise Analysis in Low-Noise CMOS Image Sensors.- Noise Reduction in CIS Readout Chains.- Design of a Sub-electron Readout Noise Pixel in a Standard CIS Process.- Characterization of a Sub-electron Readout Noise VGA Imager in a Standard CIS Process.- A Passive Switched-Capacitor Circuit For Correlated Multiple Sampling.- Downscaling Effects Towards Photon Counting Capability in CIS.- An Ultra Low Noise CMOS THz Imager.- Conclusion.</p>