Charge-Trapping Non-Volatile Memories

Volume 2--Emerging Materials and Structures

Specificaties
Gebonden, blz. | Engels
Springer International Publishing | e druk, 2017
ISBN13: 9783319487038
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Springer International Publishing e druk, 2017 9783319487038
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Samenvatting

This book describes the technology of charge-trapping non-volatile memories and their uses. The authors explain the device physics of each device architecture and provide a concrete description of the materials involved and the fundamental properties of the technology. Modern material properties, used as charge-trapping layers, for new applications are introduced.

Provides a comprehensive overview of the technology for charge-trapping non-volatile memories;
Details new architectures and current modeling concepts for non-volatile memory devices;
Focuses on conduction through multi-layer gate dielectrics stacks.

Specificaties

ISBN13:9783319487038
Taal:Engels
Bindwijze:gebonden
Uitgever:Springer International Publishing

Inhoudsopgave

Materials and Device Reliability in SONOS Memories.- Charge-Trap-Non-Volatile Memory and Focus on Flexible Flash Memory Devices.- Hybrid Memories Based on Redox Molecules.- Organic Floating-Gate Memory Structures.- Nanoparticles Based Flash-like Non Volatile Memories: Cluster Beam Synthesis of Metallic Nanoparticles and Challenges for the Overlying Control Oxide Layer.

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        Charge-Trapping Non-Volatile Memories