Ken J Stout,
Liam Blunt,
Liam (Taylor Hobson Professor of Surface Metrology at the University of Huddersfield, UK) Blunt,
W. P. Dong,
E. Mainsah,
N. Luo,
T. Mathia,
P. J. Sullivan,
H. Zahouani
e.a.
Elsevier Science
e druk, 2002
9781857180237
Development of Methods for Characterisation of Roughness in Three Dimensions
Specificaties
Paperback, blz.
|
Engels
Elsevier Science |
e druk, 2002
ISBN13: 9781857180237
Rubricering
Verwachte levertijd ongeveer 8 werkdagen
Samenvatting
Based on research funded by the European Commission, this important handbook provides a basis for a unified approach to three-dimensional surface finish assessment. It covers a broad range of issues related to 3-D micro-topography, with particular emphasis on standardisation, measurement, characterisation and interpretation. This reprint includes an updating introductory section. This work is to be the basis for a 3D international standard.
Specificaties
Inhoudsopgave
1. Updating introduction to this revised reprint; 2. An integrated approach to the assessment of 3-D micro-topography; 3. Techniques and fidelity of data collection; 4. Measurement strategy of the stylus instrument; 5. Effects of stylus geometry and loading;6. Fidelity of the measurement datum; 7. The selection of sampling conditions; 8. Specification for a unified data file format; 9. Reference for 3-D topography characterisation; 10. Digital filtering of 3-D surface topography; 11. Characterisation techniques;12. Parameters for characterising 3-D surfaces; 13. The effects of quantisation on 3-D topography characterisation; 14. Functional characterisation of engineering surfaces ; 15. Calibration of surface topography instruments.