Surface Microscopy with Low Energy Electrons

Specificaties
Paperback, blz. | Engels
Springer New York | e druk, 2016
ISBN13: 9781493939886
Rubricering
Springer New York e druk, 2016 9781493939886
Verwachte levertijd ongeveer 8 werkdagen

Samenvatting

This book, written by a pioneer in surface physics and thin film research and the inventor of Low Energy Electron Microscopy (LEEM), Spin-Polarized Low Energy Electron Microscopy (SPLEEM) and Spectroscopic Photo Emission and Low Energy Electron Microscopy (SPELEEM), covers these and other techniques for the imaging of surfaces with low energy (slow) electrons. These techniques also include Photoemission Electron Microscopy (PEEM), X-ray Photoemission Electron Microscopy (XPEEM), and their combination with microdiffraction and microspectroscopy, all of which use cathode lenses and slow electrons. Of particular interest are the fundamentals and applications of LEEM, PEEM, and XPEEM because of their widespread use. Numerous illustrations illuminate the fundamental aspects of the electron optics, the experimental setup, and particularly the application results with these instruments. Surface Microscopy with Low Energy Electrons will give the reader a unified picture of the imaging, diffraction, and spectroscopy methods that are possible using low energy electron microscopes.

Specificaties

ISBN13:9781493939886
Taal:Engels
Bindwijze:paperback
Uitgever:Springer New York

Inhoudsopgave

<p>Chapter 1. Introduction.- Chapter 2. Basic Interactions.- Chapter 3. Instrumentation.- Chapter 4. Theory of image formation.- Chapter 5. Applications in surface science.- Chapter 6. Applications in other fields.- Chapter 7. Magnetic imaging.- Chapter 8. Other surface imaging methods with electrons.</p>

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        Surface Microscopy with Low Energy Electrons