Double-Scanning Diffractometry in the Back-Reflection Region.- Determination of Lattice Constants of Polycrystalline (Monoclinic) Uranium Tetrafluoride.- The Use of a Portable X-Ray Unit for Measuring Residual Stresses in Aluminum, Titanium, and Steel Alloys.- Experimental X-Ray Stress Analysis Procedures for Ultrahigh-Strength Materials.- A Study of Defects Due to Surface Processing in Silicon by Means of X-Ray Extinction Contrast Topography.- Small-Angle X-Ray Scattering by Metastable Liquid Immiscibility in Glass.- High-Temperature Modifications of Thorium Dicarbide.- An Ultrahigh Temperature, Single-Crystal Texture Camera Diffractometer.- Ternary Carbide Phases Formed by Scandium-Group Elements with Aluminum and Carbon.- X-Ray Diffraction of Nonmetallic Phases Chemically Extracted from Columbium Alloys.- Escape Peaks in X-Ray Diffractometry.- A Computer Program for Determining Accurate Parameters from Powder Data.- Oxidation of Zirconium-Yttrium Alloys.- X-Ray Diffractometry of Polymers by a Transmission Method.- Diffraction Maxima Positions in Two Types of Liquid Organosilicon Compounds.- Modification of Collagen and Nylon Lattices by Resorcinol.- An Automated System for Extended X-Ray Absorption Measurements.- X-Ray Generation by Proton Bombardment.- A Compilation of Beta-Ray Stimulated X-Ray Spectra.- Some Instrumental Considerations in the Automatic On-Stream Analysis of Pulps for Elemental Content.- An Instrument for Soft X-Ray Selected-Area Microdiffraction.- A New Focusing Vacuum X-Ray Macroprobe Analyzer.- Evaluation and Application of an Improved Slit Probe for the X-Ray Secondary Emission Spectrometer.- The Use of an X-Ray Fluorescence Semi-Microprobe Attachment in Metallurgy.- The Application of X-Ray Fluorescence Probe Analysis to the Study of Segregation in Steels.- Some Notes on Ultrasoft X-Ray Fluorescence Analysis — 10 to 100 Å Region.- A Polycrystalline X-Ray Analyzing Crystal.- The Effect of Grating Blaze Angle on the Diffraction Efficiency of Ultrasoft X-Ray Radiation.- Preliminary Studies on the Characterization of Solution-Grown ADP Crystals.- The Diffraction of X-Rays by Multilayer Stearate Soap Films.- Some Measurements of Carbon K Excitation in a New Ultrasoft X-Ray Spectrometer.- Light Element Analysis with an Electron Microprobe.- Microprobe Analysis of Binary Systems Containing Uranium.- The Study of Electrical Contact Surfaces with an Electron Probe Microanalyzer.- The Effect of Valence and Coordination on K Series Diagram and Nondiagram Lines of Magnesium, Aluminum, and Silicon.- Some Observations on X-Ray Emission as a Function of Accelerating Voltage in the Microprobe.- A Lunar X-Ray Diffraction Experiment.- A Study of Homogeneity of Solid Solutions of Cadmium Sulfide and Cadmium Selenide by X-Ray Fluorescence.- Variation of X-Ray Spectral Line Position with Ambient-Temperature Change: A Source of Error in X-Ray Spectrography.- Determination of Rubidium in Cesium Metal by X-Ray Fluorescence Spectroscopy.- The Determination of Calcium in Uranium Ore Concentrates by X-Ray Fluorescence.- X-Ray Fluorescence in Cotton Modification Research.
