Mohammad Tehranipoor,
Ke Peng,
Krishnendu Chakrabarty
Springer New York
2012e druk, 2011
9781441982964
Test and Diagnosis for Small-Delay Defects
Specificaties
Gebonden, 212 blz.
|
Engels
Springer New York |
2012e druk, 2011
ISBN13: 9781441982964
Rubricering
Verwachte levertijd ongeveer 8 werkdagen
Samenvatting
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
Specificaties
ISBN13:9781441982964
Taal:Engels
Bindwijze:gebonden
Aantal pagina's:212
Uitgever:Springer New York
Druk:2012
Inhoudsopgave
<p>Introduction to VLSI Testing.- Delay Test and System-Delay Defects.- Long Path-Based Hybrid Method.- Process Variations- and Crosstalk-Aware Pattern Selection.- Power Supply Noise- and Crosstalk-Aware Hybrid Method.- SDD-Based Hybrid Method.- Maximizing Crosstalk Effect on Critical Paths.- Maximizing Power Supply Noise on Critical Paths.- Faster-than-at-speed Test.- Introduction to Diagnosis.- Diagnosing Noise-Induced SDDs by Using Dynamic SDF. </p>