Telman Aliev
Springer US
0e druk, 2010
9781441944108
Digital Noise Monitoring of Defect Origin
Specificaties
Paperback, 224 blz.
|
Engels
Springer US |
0e druk, 2010
ISBN13: 9781441944108
Rubricering
Onderdeel van serie
Lecture Notes in Electrical Engineering
Levertijd ongeveer 8 werkdagen
Samenvatting
This book explores the initial stage of the origin of the defect taking into account technical, biological, and other features of several technologies. These technologies allow the defect monitoring at the beginning of the defect origin to be performed at the expense of extracting information from the noise. This book appeals to a wide audience focused on solving numerous problems.
Specificaties
ISBN13:9781441944108
Taal:Engels
Bindwijze:paperback
Aantal pagina's:224
Uitgever:Springer US
Druk:0
Inhoudsopgave
Difficulties of Monitoring a Defect at Its Origin and Its Dataware Features.- Position-Binary Technology of Monitoring Defect at its Origin.- Technology of Digital Analysis of Noise as a Carrier of Information about the Beginning of a Defect's Origin.- Robust Correlation Monitoring of a Defect at its Origin.- Spectral Monitoring of a Defect's Origin.- The Digital Technology of Forecasting Failures by Considering Noise as a Data Carrier.- The Technology of Monitoring a Defect's Origin by Considering Noise as a Data Carrier.