Prithviraj Kabisatpathy,
Alok Barua,
Satyabroto Sinha
Springer US
0e druk, 2011
9781441938282
Fault Diagnosis of Analog Integrated Circuits
Specificaties
Paperback, 182 blz.
|
Engels
Springer US |
0e druk, 2011
ISBN13: 9781441938282
Rubricering
Onderdeel van serie
Frontiers in Electronic Testing
Levertijd ongeveer 8 werkdagen
Samenvatting
Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology.
Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits.
Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces .
Also contains problems that can be used as quiz or homework.
Specificaties
ISBN13:9781441938282
Taal:Engels
Bindwijze:paperback
Aantal pagina's:182
Uitgever:Springer US
Druk:0
Inhoudsopgave
Fault and Fault Modelling.- Test Stimulus Generation.- Fault Diagnosis Methodology.- Design for Testability and Built-In Self-Test.