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Scanning Probe Microscopy

Atomic Scale Engineering by Forces and Currents

Specificaties
Paperback, 282 blz. | Engels
Springer New York | 0e druk, 2010
ISBN13: 9781441923066
Rubricering
Springer New York 0e druk, 2010 9781441923066
Onderdeel van serie NanoScience and Technology
€ 180,99
Levertijd ongeveer 8 werkdagen

Samenvatting

Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today’s simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today’s research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data.

Specificaties

ISBN13:9781441923066
Taal:Engels
Bindwijze:paperback
Aantal pagina's:282
Uitgever:Springer New York
Druk:0

Inhoudsopgave

The Physics of Scanning Probe Microscopes.- SPM: The Instrument.- Theory of Forces.- Electron Transport Theory.- Transport in the Low Conductance Regime.- Bringing Theory to Experiment in SFM.- Topographic images.- Single-Molecule Chemistry.- Current and Force Spectroscopy.- Outlook.
€ 180,99
Levertijd ongeveer 8 werkdagen

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        Scanning Probe Microscopy