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Image-Based Fractal Description of Microstructures

Specificaties
Gebonden, 272 blz. | Engels
Springer US | 2003e druk, 2003
ISBN13: 9781402075070
Rubricering
Springer US 2003e druk, 2003 9781402075070
€ 120,99
Levertijd ongeveer 8 werkdagen

Samenvatting

Fractal analysis has rapidly become an important field in materials science and engineering with broad applications to theoretical analysis and quantitative description of microstructures of materials. Fractal methods have thus far shown great potential in engineering applications in quantitative microscopic analysis of materials using commercial microscopes.
This book attempts to introduce the fundamentals and the basis methods of fractal description of microstructures in combination with digital imaging and computer technologies. Basic concepts are given in the form of mathematical expressions. Detailed algorithms in practical applications are also provided. Fractal measurement, error analysis and fractal description of cluster growth, thin films and surfaces are emphasized in this book.
Image-Based Fractal Description of Microstructures provides a comprehensive approach to materials characterization by fractal from theory to application.

Specificaties

ISBN13:9781402075070
Taal:Engels
Bindwijze:gebonden
Aantal pagina's:272
Uitgever:Springer US
Druk:2003

Inhoudsopgave

1 Introduction.- 2 Digital Images of Microstructures.- 3 Image Processing.- 4 Fundamental Statistics.- 5 Fractal Fundamentals.- 6 Fractal Measurements of Projection Microstructures.- 7 Fractal Measurements of Topographical Images from 3D Surfaces.- 8 Irregularity of Graphite Nodules.- 9 Fractal Growth of Graphite Nodules.- 10 Fractal—based Study of Magnetic Thin Films.- 11 Fractal-based Study of Fracture Surfaces.- References.
€ 120,99
Levertijd ongeveer 8 werkdagen

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        Image-Based Fractal Description of Microstructures