Ch Sateesh (University of Johannesburg, South Africa) Kumar,
M. Muralidhar (Madanapalle Institute of Technology & Science, India) Singh,
Ram (NIT Jamshedpur, India) Krishna
Taylor & Francis Ltd
e druk, 2024
9781032375113
Advanced Materials Characterization
Basic Principles, Novel Applications, and Future Directions
Specificaties
Paperback, 130 blz.
|
EN
Taylor & Francis Ltd |
e druk, 2024
ISBN13: 9781032375113
Rubricering
Onderdeel van serie
Advanced Materials Processing and Manufacturing
Levertijd ongeveer 7 werkdagen
Samenvatting
The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.
Specificaties
ISBN13:9781032375113
Taal:EN
Bindwijze:Paperback
Aantal pagina's:130
Uitgever:Taylor & Francis Ltd