Particle and Particle Systems Characterization

Small-angle scattering (SAS) is the premier technique for the characterization of disordered nanoscale particle ensembles. SAS is produced by the particle as a whole and does not depend in any way on the internal crystal structure of the particle. Since the first applications of X-ray scattering in the 1930s, SAS has developed into a standard method in the field of materials science. SAS is a non-destructive method and can be directly applied for solid and liquid samples.

Particle and Particle Systems Characterization: Small-Angle Scattering (SAS) Applications is geared to any scientist who might want to apply SAS to study tightly packed particle ensembles using elements of stochastic geometry. After completing the book, the reader should be able to demonstrate detailed knowledge of the application of SAS for the characterization of physical and chemical materials.