Advances in Imaging and Electron Physics
Specificaties
Gebonden, blz.
|
Engels
Elsevier Science |
e druk, 2021
ISBN13: 9780128246122
Rubricering
Onderdeel van serie
Advances in Imaging and Electron Physics
Verwachte levertijd ongeveer 8 werkdagen
Samenvatting
Advances in Imaging and Electron Physics, Volume 219, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
Specificaties
Inhoudsopgave
<p>Preface<br>Martin Hÿtch and Peter W. Hawkes<br>1. Introduction to strain characterization method in transmission electron microscopy<br>Alexandre Pofelski︎<br>2. Moiré sampling in scanning transmission electron microscopy<br>Alexandre Pofelski︎<br>3. Scanning transmission electron microscopy moiré sampling geometrical phase analysis (STEM moiré GPA)<br>Alexandre Pofelski︎<br>4. Performance of scanning transmission electron microscopy moiré sampling geometrical phase analysis<br>Alexandre Pofelski︎<br>5. Applications of scanning transmission electron microscopy moiré sampling geometrical phase analysis<br>Alexandre Pofelski︎<br>6. Quasi-analytical modelling of charged particle ensembles in neutral gas flow and electric fields<br>Mikhail Monastyrskiy, Roman Ablizen, Anatoly Neishtadt, Alexander Makarov, and Mikhail<br>7. Superconducting electron lenses<br>David Hardy<br>8. Lorentz microscopy or electron phase microscopy of magnetic objects<br>Richard Harry Wade</p>