Peter W. Hawkes,
Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France) Hawkes
Elsevier Science
e druk, 2016
9780128048115
Advances in Imaging and Electron Physics
Specificaties
Gebonden, blz.
|
Engels
Elsevier Science |
e druk, 2016
ISBN13: 9780128048115
Rubricering
Onderdeel van serie
Advances in Imaging and Electron Physics
Levertijd ongeveer 8 werkdagen
Samenvatting
Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Specificaties
Inhoudsopgave
<p>1. Interference of Light and Material Particles, a Departure from the Superposition Principle</p> <p>R. Castañeda, G. Matteucci and R. Capelli</p> <p>2. Unified Numerical Formalism of Modal Methods in Computational Electromagnetics and Latest Advances: Applications in Nanophotonics and Plasmonics</p> <p>K. Edee, J.P. Plumey and B. Guizal</p> <p>3. Fundamentals of Focal Series Inline Electron Holography</p> <p>A. Lubk, K. Vogel, D. Wolf, J. Krehl, F. Röder, L. Clark, G. Guzzinati and J. Verbeeck</p>