, , , , , e.a.

Hot-Carrier Effects in MOS Devices

Specificaties
Gebonden, blz. | Engels
Elsevier Science | e druk, 1995
ISBN13: 9780126822403
Rubricering
Elsevier Science e druk, 1995 9780126822403
€ 66,94
Levertijd ongeveer 8 werkdagen

Samenvatting

The exploding number of uses for ultrafast, ultrasmall integrated circuits has increased the importance of hot-carrier effects in manufacturing as well as for other technological applications. They are rapidly movingout of the research lab and into the real world.

This book is derived from Dr. Takedas book in Japanese, Hot-Carrier Effects, (published in 1987 by Nikkei Business Publishers). However, the new book is much more than a translation. Takedas original work was a starting point for developing this much more complete and fundamental text on this increasingly important topic. The new work encompasses not only all the latest research and discoveries made in the fast-paced area of hot carriers, but also includes the basics of MOS devices, and the practical considerations related to hot carriers.

Specificaties

ISBN13:9780126822403
Taal:Engels
Bindwijze:Gebonden

Inhoudsopgave

MOS Device Fundamentals<br>Hot-Carrier Injection Mechanisms<br>Hot-Carrier Device Degradation<br>AC and Process-Induced Hot-Carrier Effects<br>Hot-Carrier Effects at Low Temperature and Low Voltage<br>Dependence of Hot-Carrier Phenomena on Device Structure<br>As-P Double Diffused Drain (DDD) Versus Lightly Doped Drain (LDD) Devices<br>Gate-to-Drain Overlatpped Devices (GOLD)
€ 66,94
Levertijd ongeveer 8 werkdagen

Rubrieken

    Personen

      Trefwoorden

        Hot-Carrier Effects in MOS Devices