Peter W. Hawkes
Elsevier Science
e druk, 2012
9780123943965
Advances in Imaging and Electron Physics
Specificaties
Gebonden, blz.
|
Engels
Elsevier Science |
e druk, 2012
ISBN13: 9780123943965
Rubricering
Onderdeel van serie
Advances in Imaging and Electron Physics
Levertijd ongeveer 8 werkdagen
Samenvatting
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Specificaties
Inhoudsopgave
<ol> <li>Precession Electron DiffractionA. S. Eggeman and P. A. Midgley</li> <p> <li>Scanning Helium Ion MicroscopyR. Hill, J. A. Notte, and L. Scipioni</li> <p> <li>Signal reconstruction algorithm based on a single intensity in the Fresnel domainHone-Ene Hwang, Pin Han</li> <p> <li>Electron Microscopy Studies on Magnetic L1<sub>0</sub> FePd NanoparticlesKazuhisa Sato, Toyohiko J. Konno, Yoshihiko Hirotsu</li> <p> <li>Fundamental aspects of Near Field Emission Scanning Electron MicroscopyD. A. Zanin, H. Cabrera, L. De Pietro, M. Pikulski, M. Goldmann, U. Ramsperger, D. Pescia, J. P. Xanthakis</li></ol>