Peter W. Hawkes
Elsevier Science
e druk, 2011
9780123859839
Advances in Imaging and Electron Physics
Optics of Charged Particle Analyzers
Specificaties
Gebonden, blz.
|
Engels
Elsevier Science |
e druk, 2011
ISBN13: 9780123859839
Rubricering
Onderdeel van serie
Advances in Imaging and Electron Physics
Levertijd ongeveer 8 werkdagen
Samenvatting
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Specificaties
Inhoudsopgave
<ol> <li>The synthesis of a Stochastic Artificial Neural Network application using a Genetic Algorithm approach</li> <p>LucaGeretti, AntonioAbramo</p> <p> <li>Logarithmic Image Processing for Color Images</li> <p>M. Jourlin, J. Breugnot, F. Itthirad, M. Bouabdellah, B. Closs</p> <p> <li>Current Technologies for High Speed and Functional Imaging with Optical Coherence Tomography</li> <p>Rainer A. Leitgeb</p> <p> <li>Analysis of optical systems, contrast depth and measurement of electric and magnetic field distribution on the object’s surface in mirror electron microscopy</li> <p>S.A. Nepijko, G. Schönhense</p> <p> <li>Multivariate statistics applications in scanning transmission electron microscopy X-ray spectrum imaging</li> <p>Chad M. Parish</p> <p> <li>Aberration Correctors developed under Triple C Project</li> <p>Hidetaka Sawada, Fumio Hosokawa, Takeo Sasaki, Toshikatsu Kaneyama, Yukihito Kondo, Kazutomo Suenaga</p> <p> <li>Spatially resolved thermoluminescence in a scanning electron microscope</li> </ol> <p>T. Schulz, M. Albrecht, K.Irmscher</p>