Electromigration In Ulsi Interconnections

Specificaties
Gebonden, 312 blz. | EN
World Scientific Publishing Co Pte Ltd | e druk, 2010
ISBN13: 9789814273329
Rubricering
World Scientific Publishing Co Pte Ltd e druk, 2010 9789814273329
Verwachte levertijd ongeveer 16 werkdagen

Samenvatting

Presents a description of the electro migration in integrated circuits. This book examines the various interconnected systems and their evolution employed in integrated circuit technology. It is suitable for readers on electro migration in ULSI interconnections.

Specificaties

ISBN13:9789814273329
Taal:EN
Bindwijze:Gebonden
Aantal pagina's:312
Uitgever:World Scientific Publishing Co Pte Ltd

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        Electromigration In Ulsi Interconnections