Applied Scanning Probe Methods IX
Characterization
Samenvatting
The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely and comprehensive overview of SPM applications.
Specificaties
Inhoudsopgave
Hyonchol Kim, Hironori Uehara, Rehana Afrin, Hiroshi Sekiguchi, Hideo Arakawa, Toshiya Osada, and Atsushi Ikai: Application of the Atomic Force Microscopy to the Study of Expressed Molecules in or on a Single Living Cell.- Annalisa Relini, Claudio Canale, Ornella Cavalleri, Tiziana Svaldo Lanero, Ranieri Rolandi, and Alessandra Gliozzi: What can atomic force microscopy say about amyloid aggregates?.- Zoya Leonenko, Matthias Amrein, David T. Cramb, and Eric Finot: Atomic force microscopy: interaction forces in phospholipid monolayers, bilayers and cell membranes.- Enamul Hoque, James DeRose, B. Bhushan, and H. J. Mathieu: Self-Assembled Monolayers (SAM) on Aluminum and Copper Oxide Surfaces: Surface and Interface Characteristics, Nanotribological Properties, and Chemical Stability.- Nikhil S. Tambe and Bharat Bhushan: High Sliding Velocity Nanotribological Investigations of Materials for Nanotechnology Applications.- Sung-Kyoung Kim and Haiwon Lee: Measurement of Mechanical Properties of One-Dimensional Polymer Nanostructures by AFM.- Sriram Sundararajan and K. S. Kanaga Karuppiah: Evaluating Interfacial Properties of Polymeric Materials for Total Joint Replacements Using ScanningProbe Microscopy.- Toshiharu Saiki: Near-field optical spectroscopy of single quantum constituents

