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Scanning Probe Microscopy

The Lab on a Tip

Specificaties
Gebonden, 210 blz. | Engels
Springer Berlin Heidelberg | 2004e druk, 2003
ISBN13: 9783540431800
Rubricering
Springer Berlin Heidelberg 2004e druk, 2003 9783540431800
Onderdeel van serie Advanced Texts in Physics
Verwachte levertijd ongeveer 9 werkdagen

Samenvatting

Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.

Specificaties

ISBN13:9783540431800
Taal:Engels
Bindwijze:gebonden
Aantal pagina's:210
Uitgever:Springer Berlin Heidelberg
Druk:2004

Inhoudsopgave

1 Introduction to Scanning Probe Microscopy.- 2 Introduction to Scanning Tunneling Microscopy.- 3 Force Microscopy.- 4 MFM and Related Techniques.- 5 Other Members of the SPM Family.- 6 Artifacts in SPM.- 7 Prospects for SPM.- References.

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        Scanning Probe Microscopy