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CCD Image Sensors in Deep-Ultraviolet

Degradation Behavior and Damage Mechanisms

Specificaties
Gebonden, 232 blz. | Engels
Springer Berlin Heidelberg | 2005e druk, 2005
ISBN13: 9783540226802
Rubricering
Springer Berlin Heidelberg 2005e druk, 2005 9783540226802
Onderdeel van serie Microtechnology and MEMS
Verwachte levertijd ongeveer 8 werkdagen

Samenvatting

As the deep-ultraviolet (DUV) laser technology continues to mature, an increasing number of industrial and manufacturing applications are emerging. For example, the new generation of semiconductor inspection systems is being pushed to image at increasingly shorter DUV wavelengths to facilitate inspection of deep sub-micron features in integrated circuits. DUV-sensitive charge-coupled device (CCD) cameras are in demand for these applications. Although CCD cameras that are responsive at DUV wavelengths are now available, their long-term stability is still a major concern. This book describes the degradation mechanisms and long-term performance of CCDs in the DUV, along with new results of device performance at these wavelengths.

Specificaties

ISBN13:9783540226802
Taal:Engels
Bindwijze:gebonden
Aantal pagina's:232
Uitgever:Springer Berlin Heidelberg
Druk:2005

Inhoudsopgave

Overview of CCD.- CCD Imaging in the Ultraviolet (UV) Regime.- Silicon.- Silicon Dioxide.- Si-SiO2 Interface.- General Effects of Radiation.- Effects of Radiation on CCDs.- UV-Induced Effects in Si.- UV Laser Induced Effects in SiO2.- UV Laser Induced Effects at the Si-SiO2 Interface.- CCD Measurements at 157nm.- Design Optimizations for Future Research.- Concluding Remarks.

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        CCD Image Sensors in Deep-Ultraviolet