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Characterization of Polymers in the Solid State II

Synchrotron Radiation, X-ray Scattering and Electron Microscopy

Specificaties
Gebonden, blz. | Engels
Springer Berlin Heidelberg | e druk, 1984
ISBN13: 9783540137801
Rubricering
Springer Berlin Heidelberg e druk, 1984 9783540137801
Onderdeel van serie Advances in Polymer Science
€ 96,99
Levertijd ongeveer 8 werkdagen

Specificaties

ISBN13:9783540137801
Taal:Engels
Bindwijze:gebonden
Uitgever:Springer Berlin Heidelberg

Inhoudsopgave

Synchrotron radiation in polymer science.- Position sensitive X-ray detectors.- Fluorescence Anisotropy technique using Synchrotron Radiation as a powerful means for studying the orientation correlation functions of polymer chains.- Resonance scattering in macromolecular structure research.- X-ray line shape analysis. A means for the characterization of crystalline polymers.- Use of transmission electron microscopy to obtain quantitative information about polymers.
€ 96,99
Levertijd ongeveer 8 werkdagen

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        Characterization of Polymers in the Solid State II