Defect Sizing Using Non-destructive Ultrasonic Testing

Applying Bandwidth-Dependent DAC and DGS Curves

Specificaties
Paperback, blz. | Engels
Springer International Publishing | e druk, 2018
ISBN13: 9783319813790
Rubricering
Springer International Publishing e druk, 2018 9783319813790
€ 132,99
Levertijd ongeveer 8 werkdagen

Samenvatting

This book presents a precise approach for defect sizing using ultrasonics. It describes an alternative to the current European and American standards by neglecting their limitations. The approach presented here is not only valid for conventional angle beam probes, but also for phased array angle beam probes. It introduces an improved method which provides a significant productivity gain and calculates curves with high accuracy. Its content is of interest to all those working with distance gain size (DGS) methods or are using distance amplitude correction (DAC) curves.

Specificaties

ISBN13:9783319813790
Taal:Engels
Bindwijze:paperback
Uitgever:Springer International Publishing

Inhoudsopgave

Preface.- Sizing Methods: Distance Gain Size (DGS) and Distance Amplitude Correction (DAC).- A new approach to bring DGS and DAC close together.- Diagrams.- Perspectives.
€ 132,99
Levertijd ongeveer 8 werkdagen

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        Defect Sizing Using Non-destructive Ultrasonic Testing