Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction

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Gebonden, 348 blz. | EN
Imperial College Press | e druk, 2010
ISBN13: 9781848165366
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Imperial College Press e druk, 2010 9781848165366
Verwachte levertijd ongeveer 16 werkdagen

Samenvatting

Presents an introduction to practical aspects of atomic-resolution imaging in aberration-corrected electron microscopy. This book addresses advances in electron optical instrumentation used for ultra-high resolution imaging in materials and nano-science.

Specificaties

ISBN13:9781848165366
Taal:EN
Bindwijze:Gebonden
Aantal pagina's:348

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        Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction