Massimo Vanzi,
Laurent Bechou,
Mitsuo Fukuda,
Giovanna Mura
e.a.
Elsevier Science
e druk, 2021
9781785481543
Advanced Laser Diode Reliability
Specificaties
Gebonden, blz.
|
Engels
Elsevier Science |
e druk, 2021
ISBN13: 9781785481543
Rubricering
Verwachte levertijd ongeveer 9 werkdagen
Samenvatting
Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction.
Specificaties
Inhoudsopgave
<p>1. Laser Diode Reliability<br>2. Multi-Component Model for Semiconductor Laser Degradation<br>3. Reliability of Laser Diodes for High-Rate Optical Communications - A Monte Carlo-Based Method to Predict Lifetime Distributions and Failure Rates in Operating Conditions<br>4. Laser Diode Characteristics<br>5. Laser Diode DC Measurement Protocols</p>