Manjul Bhushan,
Mark B. Ketchen
Springer New York
e druk, 2016
9781493947027
CMOS Test and Evaluation
A Physical Perspective
Specificaties
Paperback, blz.
|
Engels
Springer New York |
e druk, 2016
ISBN13: 9781493947027
Rubricering
Verwachte levertijd ongeveer 9 werkdagen
Samenvatting
CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.
Specificaties
ISBN13:9781493947027
Taal:Engels
Bindwijze:paperback
Uitgever:Springer New York
Inhoudsopgave
<p>Introduction.- CMOS Circuit Basics.- CMOS Storage Elements and Synchronous Logic.- IDDQ and Power.- Embedded PVT Monitors.- Variability.- Product Chip Test and Characterization.- Reliability, Burn-In and Guardbands.- Data Analysis and Characterization.- CMOS Metrics and Model Evaluation.</p>