Cédric Clévy,
Micky Rakotondrabe,
Nicolas Chaillet
Springer New York
e druk, 2014
9781489990396
Signal Measurement and Estimation Techniques for Micro and Nanotechnology
Specificaties
Paperback, blz.
|
Engels
Springer New York |
e druk, 2014
ISBN13: 9781489990396
Rubricering
Levertijd ongeveer 8 werkdagen
Samenvatting
Signal Measurement and Estimation Techniques for Micro and Nanotechnology discusses micro, nano and robotic cells and gives a state-of-the-art presentation of the different techniques and solutions to measure and estimate signals at the micro and nano scale. New technologies and applications such as micromanipulation (artificial components, biological objects), micro-assembly (MEMS, MOEMS, NEMS) and material and surface force characterization are covered. The importance of sensing at the micro and nano scale is presented as a key issue in control systems, as well as for understanding the physical phenomena of these systems. The book also:
- Explains issues that make signal measurement and estimation techniques difficult at the micro-nano-scale and offers solutions
- Discusses automated micro-assembly, and control of micro-nano robotic devices
- Presents and links signal measurement and estimation techniques for micro-nano scale systems with microfabrication methods, sensors integration and control schemes
Signal Measurement and Estimation Techniques for Micro and Nanotechnology is a must-read for researchers and engineers working in MEMS and control systems.
Specificaties
ISBN13:9781489990396
Taal:Engels
Bindwijze:paperback
Uitgever:Springer New York
Inhoudsopgave
Microscale Specificities.- Observer Techniques Applied to the Control of Piezoelectric Microactuators.- Measurement and Control for High-Speed Sub-Atomic Positioning in Scanning Probe Microscopes.- Microrobotic tools for the measurement of small forces.- Distinguishing Healthy and Defective Oocytes during Intracytoplasmic Sperm Injection.- In situ Characterizations of Thin-film Nanostructures with Large-range Direct Force Sensing.- A mechanism approach for enhancing the dynamic range and linearity of MEMS Optical Force Sensing.- Observer-based estimation of weak forces in a nanosystem measurement device.