Multi-Chip Module Test Strategies

Foreword; V.D. Agrawal. MCM Testing Background: Fundamentals of MCM Testing and Design-For-Testability; Y. Zorian. Die Level Testing: Known Good Die; L. Gilg. Substrate Testing: A Survey of Test Techniques for MCM Substrates; M. Swaminathan, et al. Smart Substrate MCMs; A. Gattiker, W. Maly. Electron Beam Probing - A Solution for MCM Test and Failure Analysis; R. Schmid, et al. Module Level Test: MCM Test Strategy Synthesis from Chip Test and Board Test Approaches; A. Flint. Designing `Dual Personality' IEEE 1149.1 Compliant Multi-Chip Modules; N. Jarwala. An Effective Multi-Chip BIST Scheme; Y. Zorian, H. Bederr. MCM Test Applications: Design-For-Test in a Multiple Substrate Multichip Module; J.A. Jorgenson, R.J. Wagner. A Test Methodology for High Performance MCMs; T.M. Storey, B. McWilliam. Module Level Diagnosis: A Formalization of the IEEE 1149.1-1990 Diagnostic Methodology as Applied to Multichip Modules; K. Posse. Multichip Module Diagnosis by Product-Code Signatures; P. Nagvajara, et al. Simulation Techniques for MCMs: Simulation Techniques for the Manufacturing Test of MCMs; M. Tegethoff, T. Chen. MCM Test Economics: Economic Analysis of Test Process Flows for Multichip Modules Using Known Good Die; C.F. Murphy, et al. Index.