Miloš Stanisavljević,
Alexandre Schmid,
Yusuf Leblebici
Springer New York
2011e druk, 2010
9781441962164
Reliability of Nanoscale Circuits and Systems
Methodologies and Circuit Architectures
Specificaties
Gebonden, 195 blz.
|
Engels
Springer New York |
2011e druk, 2010
ISBN13: 9781441962164
Rubricering
Verwachte levertijd ongeveer 8 werkdagen
Samenvatting
This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.
Specificaties
ISBN13:9781441962164
Taal:Engels
Bindwijze:gebonden
Aantal pagina's:195
Uitgever:Springer New York
Druk:2011
Inhoudsopgave
Introduction.- Reliability, Faults and Fault Models.- Nanotechnology and Nanodevices.- Fault-Tolerant Architectures and Approaches.- Reliability Evaluation Techniques.- Averaging Design Implementations.- Statistical Evaluation of Fault-Tolerance Using Proability Density Functions.- System Level Reliability Evaluation and Optimization.- Summary and Conclusions.- References.