Tian-Xiao He,
Zuhair Nashed,
Earl Taft
CRC Press
1e druk, 2017
9781138442665
Wavelet Analysis and Multiresolution Methods
Specificaties
Gebonden, 400 blz.
|
Engels
CRC Press |
1e druk, 2017
ISBN13: 9781138442665
Rubricering
Onderdeel van serie
Lecture Notes in Pure and Applied Mathematics
Levertijd ongeveer 10 werkdagen
Samenvatting
This volume contains papers selected from the Wavelet Analysis and Multiresolution Methods Session of the AMS meeting held at the University of Illinois at Urbana-Champaign. The contributions cover: construction, analysis, computation and application of multiwavelets; scaling vectors; nonhomogenous refinement; mulivariate orthogonal and biorthogonal wavelets; and other related topics.