Friedrich (Siemens AG, Munich, Germany) Beck
John Wiley & Sons Inc
e druk, 1998
9780471974017
Integrated Circuit Failure Analysis
A Guide to Preparation Techniques
Specificaties
Gebonden, 192 blz.
|
EN
John Wiley & Sons Inc |
e druk, 1998
ISBN13: 9780471974017
Rubricering
Onderdeel van serie
Quality and Reliability Engineering Series
Levertijd ongeveer 15 werkdagen
Samenvatting
The construction and failure analysis of highly integrated semiconductor components has gained in significance with the explosive growth in the semiconductor industry. Once a subordinate laboratory task, semiconductor failure analysis has now become a discipline in its own right.
Specificaties
ISBN13:9780471974017
Taal:EN
Bindwijze:Gebonden
Aantal pagina's:192
Uitgever:John Wiley & Sons Inc