Alvin W. (IBM) Strong,
Ernest Y. (IBM) Wu,
Rolf-Peter (Infineon) Vollertsen,
Jordi (Universitat Autonoma de Barcelona, Spain) Sune,
Giuseppe (IBM) La Rosa,
Timothy D. (IBM) Sullivan,
Stewart E. Rauch
e.a.
John Wiley & Sons Inc
e druk, 2009
9780471731726
Reliability Wearout Mechanisms in Advanced CMOS Technologies
Specificaties
Gebonden, 640 blz.
|
EN
John Wiley & Sons Inc |
e druk, 2009
ISBN13: 9780471731726
Rubricering
Onderdeel van serie
IEEE Press Series on Microelectronic Systems
Levertijd ongeveer 15 werkdagen
Samenvatting
This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience.
Specificaties
ISBN13:9780471731726
Taal:EN
Bindwijze:Gebonden
Aantal pagina's:640
Uitgever:John Wiley & Sons Inc