Polymer Microscopy

<P>Introduction to polymer morphology. -Polymer materials. -Introduction. -Definitions. -Polymer morphology. -Amorphous polymers. -Semicrystalline polymers. -Liquid crystalline polymers. -Polymer processes. -Others that could be incorporated into 3rd ed.include: blown film processing; coating process, multi-layer extrusion. -Extrusion of fibers and films. -Extrusion and molding. -Polymer characterization. -General techniques. -Microscopy techniques. -Specimen preparation methods. -Applications of microscopy to polymers. -New microscopy techniques. -Fundamentals of microscopy. -Introduction. -Lens - imaging microscopes. -Scanning - imaging microscopes. -Optical microscopy (OM). -Introduction </P>
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<P>Objective lenses
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<P>Imaging modes
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<P>Measurement of refractive index
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<P>Polarized light
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<P>Scanning electron microscopy (SEM)
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<P>Introduction
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<P>Imaging signals
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<P>SEM optimization
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<P>Special SEM types
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<P>-FESEM is now standard</P>
<P>Transmission electron microscopy (TEM)
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<P>Imaging in the TEM
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<P>Diffraction techniques
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<P>Phase contrast and lattice imaging
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<P>Scanning probe microscopy (SPM)
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<P>Introduction
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<P>Family of techniques figure, with emphasis on force microscopy</P>
<P>Imaging Modes
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<P>a) Contact mode, incl. force modulation and friction;b) Tapping and Phase;c) Non- contact, incl. EFM and MFM</P>
<P>SPM Probes
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<P>Microscopy of radiation sensitive materials
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<P>condense this section, and/or move to new artifacts or issues topic </P>
<P>SEM operation
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<P>Low dose TEM operation
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<P>Analytical microscopy
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<P>X-ray microanalysis
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<P>X-ray analysis in the SEM vs AEM
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<P>Elemental mapping
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<P>EELS
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<P>Electron energy loss in conjuntion with morphology (TEM)</P>
<P>Quantitative microscopy
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<P>Calibration
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<P>-describe needs for SPM - 3 dimensional calibration of distance; force calibration</P>
<P>Image processing
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<P>Stereology and image analysis
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<P>-description of advantages of phase image contrast by SPM as input for IA </P>
<P>Dynamic microscopy
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<P>Stages for dynamic microscopy
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<P>Include SPM tensile and hot stages </P>
<P>Imaging theory
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<P>Imaging with lenses
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<P>Basic optics
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<P>Resolution
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<P>Electron diffraction
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<P>Contrast mechanisms
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<P>Illumination systems
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<P>Imaging by scanning electron beam
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<P>Scanning optics
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<P>Beam - specimen interactions
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<P>Image formation
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<P>Imaging by scanning a solid probe
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<P>-complete re-write, simplifying equations for important concepts</P>
<P>Contact modes
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<P>Force interactions, Image and contrast formation </P>
<P>Intermittent contact mode and phase imaging
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<P>Force interactions, all the stuff about cantilever dynamics, linear vs. non-linear and practical aspects of contrast formation </P>
<P>Non-contact modes
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<P>Long range forces and image formation in EFM and MFM</P>
<P>Artifacts due to probe-surface interaction
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<P>Polarizing microscopy
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<P>Polarized light
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<P>Anisotropic materials
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<P>Polarizing microscopy
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<P>Radiation effects
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<P>- will consider moving to a topic on artifacts </P>
<P>Effect of radiation on polymers
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<P>Radiation doses and specimen heating
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<P>Effects of radiation damage on the image
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<P>Noise limited resolution
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<P>Image processing
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<P>Specimen preparation methods
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<P>Simple preparation methods
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<P>Optical methods
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<P>SEM methods
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<P>TEM methods
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<P>SPM methods
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<P>Polishing
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<P>Microtomy
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<P>Peelback of fibers/films for SEM
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<P>Microtomy for OM
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<P>MIcrotomy for SEM
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<P>Microtomy for SPM
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<P>Microtomy for TEM
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<P>Ultrathin sectioning
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<P>Ultrathin cryosectioning
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<P>Staining
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<P>Introduction
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<P>Osmium tetroxide
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<P>Ebonite
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<P>Chlorosulfonic acid
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<P>Phosphotungstic acid
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<P>Ruthenium tetroxide
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<P>Silver sulfide
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<P>Mercuric trifluoroacetate
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<P>Iodine
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<P>Summary
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<P>Etching
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<P>Introduction
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<P>Plasma and ion etching
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<P>Solvent and chemical etching
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<P>Acid etching
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<P>Summary
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<P>Replication
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<P>Simple replicas
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<P>Replication for TEM
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<P>Conductive coatings
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<P>Coating devices
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<P>Coatings for TEM
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<P>Coatings for SEM and SPM
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<P>Artifacts
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<P>Gold decoration
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<P>Yielding and fracture
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<P>Fractography
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<P>Fracture: standard physical testing
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<P>In situ deformation
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<P>in-situ AFM tensile stages</P>
<P>Crazing
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<P>thinning in crazed zones </P>
<P>Freezing and drying methods
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<P>Simple freezing methods
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<P>Freeze drying
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<P>Critical point drying
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<P>Freeze fracture-etching
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<P>Polymer applications
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<P>Include in each of those specific SPM examples </P>
<P>Fibers
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<P>Introduction
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<P>Textile fibers
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<P>Problem solving applications
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<P>Industrial fibers
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<P>Films and membranes
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<P>Introduction
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<P>Model studies
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<P>Industrial films
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<P>Thin Films for Electronics
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<P>Abrasion Resistant Coatings
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<P>Flat film membranes
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<P>Hollow fiber membranes
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<P>Engineering resins and plastics
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<P>Introduction
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<P>Semicrystalline polymers
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<P>Amorphous polymers
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<P>Extrudates and molded parts
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<P>Multiphase polymers
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<P>Failure analysis
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<P>Image analysis of impact modified resins
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<P>Composites
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<P>Introduction
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<P>Composite characterization
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<P>Fiber composites
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<P>Particle filled composites
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<P>Carbon black filled rubber
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<P>Nanocomposites
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<P>Emulsions and adhesives
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<P>Introduction
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<P>Latexes
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<P>Wettability
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<P>Adhesives and adhesion
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<P>Liquid crystalline polymers
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<P>Decrease level of detail in this section</P>
<P>Introduction
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<P>Optical textures
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<P>Solid state structures
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<P>High modulus fibers
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<P>Structure-property relations in LCPs
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<P>&nbsp;</P>
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<P>New techniques in polymer microscopy
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<P>This will be an entirely new chapter</P>
<P>Introduction
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<P>Optical microscopy
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<P>Confocal scanning microscopy
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<P>Near field optical microscopy
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<P>Scanning electron microscopy (SEM)
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<P>Low voltage SEM
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<P>High resolution SEM
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<P>High pressure (environmental) SEM
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<P>EDS detection
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<P>Solid State detectors
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<P>Calorimetric detectors
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<P>Transmission electron microscopy (TEM)
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<P>High resolution TEM
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<P>Structure determination by electron diffraction
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<P>environmental TEM
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<P>3D tomography
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<P>Scanning tunneling microscopy (STM)
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<P>Only keep a small section</P>
<P>Principles of STM
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<P>Instrumentation and operation of the STM
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<P>STM of insulators
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<P>Adsorbed organic molecules
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<P>Other polymer applications
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<P>Scanning force microscopy (SFM)
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<P>6.6.1 New probes and atomic resolution</P>
<P>6.6.2 Fast scanning SPMs</P>
<P>6.6.3 Nanoscale mechanical mapping</P>
<P>6.6.4 Environmental SPM</P>
<P>6.6.5 Chemical Force Microscopy (CFM)</P>
<P>6.6.6 Nanomanipulation with AFM</P>
<P>New emerging techniques
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<P>Near field scanning optical microscopy
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<P>X-ray microscopy (STXM
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<P>Tomography
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<P>X-ray methodologies</P>
<P>Micro-CT or Nano-CT (benchtop x- ray)</P>
<P>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;-resolution and speed for identifying flaws</P>
<P>Imaging surface science
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<P>Short section if included at all-SIMS, XPS, PEEM, SPEM</P>
<P>Problem solving summary
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<P>Where to start
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<P>Problem solving protocol
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<P>Polymer structures
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<P>Instrumental techniques
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<P>Comparison of techniques
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<P>Optical techniques
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<P>SEM techniques
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<P>TEM techniques
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<P>STEM techniques
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<P>SFM techniques
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<P>Technique selection
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<P>Interpretation
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<P>Artifacts
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<P>Summary
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<P>Supporting characterizations
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<P>X-ray diffraction
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<P>Thermal analysis
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<P>Spectroscopy
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<P>Scattering
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<P>Summary
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<P>&nbsp;</P>
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<P>Appendixes
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<P>Appendix I Abbreviations of polymer names
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<P>Appendix II List of acronyms - techniques
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<P>Appendix III Manmade polymer fibers
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<P>Appendix IV Common commercial polymers and tradenames for plastics, films and engineering resins
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<P>See what reviewers think about need for update below</P>
<P>Appendix V General suppliers of microscopy accessories
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<P>Appendix VI Suppliers of optical and electron microscopes
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<P>Appendix VII Suppliers of x-ray microanalysis equipment
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<P>Appendix VIII Suppliers of scanning probe microscopes
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<P>Index</P>