Prithviraj Kabisatpathy,
Alok Barua,
Satyabroto Sinha
Springer US
2005e druk, 2005
9780387257426
Fault Diagnosis of Analog Integrated Circuits
Specificaties
Gebonden, 182 blz.
|
Engels
Springer US |
2005e druk, 2005
ISBN13: 9780387257426
Rubricering
Onderdeel van serie
Frontiers in Electronic Testing
Levertijd ongeveer 8 werkdagen
Samenvatting
Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology.
Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits.
Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces .
Also contains problems that can be used as quiz or homework.
Specificaties
ISBN13:9780387257426
Taal:Engels
Bindwijze:gebonden
Aantal pagina's:182
Uitgever:Springer US
Druk:2005
Inhoudsopgave
Fault and Fault Modelling.- Test Stimulus Generation.- Fault Diagnosis Methodology.- Design for Testability and Built-In Self-Test.