J. C. (, Harwell Laboratory) Riviere,
,
J. C. Rivière
e druk, 1990
9780198513704
Surface Analytical Techniques
Specificaties
Gebonden, 716 blz.
|
Engels
|
e druk, 1990
ISBN13: 9780198513704
Rubricering
Onderdeel van serie
Monographs on the Physics and Chemistry of Materials
Verwachte levertijd ongeveer 11 werkdagen
Samenvatting
There are numerous techniques available for providing detailed compositional information of the surface of materials. This volume aims to clarify those techniques which use particles as various kinds of probes for surface analysis. For each technique it provides a description of the physical principle, the method of operation, the nature of information, the range of application, and the advantages and disadvantages of each of the current techniques of surface compositional analysis. The techniques are grouped according to the nature of the incident radiation: electron excitation, photon excitation, ion excitation, and neutral excitation.
Specificaties
ISBN13:9780198513704
Taal:Engels
Bindwijze:Gebonden
Aantal pagina's:716
Inhoudsopgave
Introduction; Resum`e of physical principles; Instrumentation; Electron excitation: AES and SAM; Electron excitation: ELS, CEELS, and HREELS; Electron excitation: SXAPS, AEAPS, and DAPS; Electron excitation: IPES; Electron excitation: CLS and EIL; Electron excitation: ESD and ESDIAD; Photon excitation: XPS and XAES; Photon excitation: UPS and SRPS; Photon excitation: RAIRS and SERS; Ion excitation: AES and PAES; Ion excitation: INS and MQS; Ion excitation: IBSCA and GDOS; Ion excitation: ISS; Ion excitation: SSIMS; Ion excitation: SNMS and GDMS; Neutral excitation: FABMS; High field excitation: IETS; High field excitation: APFIM; High field excitation: STM and STS; Thermal excitation: TDS.