X. Jane Jiang,
X. Jane (Royal Academy of Engineering/Renishaw Chair in Precision Metrology, University of Huddersfield, and Director of the UK National Hub for Future Metrology, UK) Jiang,
Paul J. Scott,
Paul J. (Taylor Hobson Chair in Computational Geometry, University of Huddersfield, UK) Scott
e.a.
Elsevier Science
e druk, 2020
9780128218150
Advanced Metrology
Freeform Surfaces
Specificaties
Gebonden, blz.
|
Engels
Elsevier Science |
e druk, 2020
ISBN13: 9780128218150
Rubricering
Levertijd ongeveer 8 werkdagen
Samenvatting
Advanced Metrology: Freeform Surfaces provides the perfect guide for engineering designers and manufacturers interested in exploring the benefits of this technology. The inclusion of industrial case studies and examples will help readers to implement these techniques which are being developed across different industries as they offer improvements to the functional performance of products and reduce weight and cost.
Specificaties
Inhoudsopgave
<p>1. Introduction2. Fundaments for Freeform Surfaces3. Sampling for Freeform Surfaces4. Freeform Surface Fitting5. Linear and Non-linear Diffusion Filtration6. Morphological Filtration7. Wavelets Filtration8. Segmentation of Features on Freeform Surfaces9. Characterisation for Freeform Surfaces10. Characterisation of Freeform Structured Surfaces11. Freeform Surface Design and Metrology Platform12. Summary and Conclusion</p>