Advances in Imaging and Electron Physics
Specificaties
Gebonden, blz.
|
Engels
Elsevier Science |
e druk, 2017
ISBN13: 9780128120866
Rubricering
Onderdeel van serie
Advances in Imaging and Electron Physics
Verwachte levertijd ongeveer 9 werkdagen
Samenvatting
Advances in Imaging and Electron Physics, Volume 204, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Specificaties
Inhoudsopgave
<p>1. New physical principle for interference of light and material particles<br>Roman Castaneda and Giorgio Matteucci<br>2. A Review of Scanning Electron Microscopy in Near Field Emission Mode<br>Taryl L. Kirk<br>3. Nonscalar Mathematical Morphology<br>Jasper van de Gronde and Jos B.T.M. Roerdink<br>4. Energy Analysing and Energy Selecting Electron Microscopes<br>A.J.F. Metherel</p>