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Advances in Imaging and Electron Physics

Specificaties
Gebonden, blz. | Engels
Elsevier Science | e druk, 2015
ISBN13: 9780128023808
Rubricering
Elsevier Science e druk, 2015 9780128023808
€ 219,75
Levertijd ongeveer 8 werkdagen

Samenvatting

Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Specificaties

ISBN13:9780128023808
Taal:Engels
Bindwijze:Gebonden

Inhoudsopgave

<ol> <li>CISCEM 2014 Niels de Jonge</li> <li>Progress and Development of Direct Detectors for Cryo-Electron MicroscopyA. R. Faruqi, Richard Henderson, and Greg McMullan</li> <li>Electron Optics and Electron Microscopy Conference Proceedings and Abstracts: A Supplement Peter W. Hawkes</li> <li>Scanning Thermal Microscopy (SThM): How to Map Temperature and Thermal Properties at the NanoscaleGrzegorz Wielgoszewski and Teodor Gotszalk</li></ol>
€ 219,75
Levertijd ongeveer 8 werkdagen

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        Advances in Imaging and Electron Physics