Peter W. Hawkes
Elsevier Science
e druk, 2010
9780123813145
Advances in Imaging and Electron Physics
Optics of Charged Particle Analyzers
Specificaties
Gebonden, blz.
|
Engels
Elsevier Science |
e druk, 2010
ISBN13: 9780123813145
Rubricering
Onderdeel van serie
Advances in Imaging and Electron Physics
Levertijd ongeveer 8 werkdagen
Samenvatting
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Specificaties
Inhoudsopgave
<ol> <p> <li>Identification Of Historical Pigments In Wall Layers By Combination Of Optical And Scanning Electron Microscopy Coupled To Energy Dispersive Spectroscopy - A. Sever Skapin</li> <p> <li>Optical interference near surfaces and its application in sub-wavelength microscopy - W. S. Bacsa</li> <p> <li>Introduction of a Quantum of Time (\chronon"), and its Consequences for the Electron in Quantum and Classical Physicsy – Ruy H. A Farias and Erasmo RECAMI</li> <p> <li>Superresolution Imaging – Revisited - Markus E. Testorf</li> <p> <li>Methods and Limitations of Subwavelength Imaging Andrew Neice</li> </ol>