Nicholas W.M. Ritchie
- Auteur
Geschreven door Nicholas W.M. Ritchie
Joseph Goldstein
Nicholas Ritchie
John Henry Scott
Dale Newbury
Dale Newbury
David Joy
Joseph Michael
Joseph Michael
Nicholas W.M. Ritchie
John Henry Scott
Joseph Goldstein
Scanning Electron Microscopy and X-Ray Microanalysis
This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams.
Meer
